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Microstructural Characterization of High Indium-Composition InXGa1-XN Epilayers Grown on c-Plane Sapphire Substrates [2014-03-28] |
| Microstructural Characterization of High Indium-Composition InXGa1-XN Epilayers Grown on c-Plane Sapphire Substrates
Microsc. Microanal. 19, S5, 145–148, 2013
 Microstructural Characterization of High Indium-Composition InXGa1-XN Epilayers Grown on c-Plane Sapphire Substrates.pdf
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