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InAs-Channel Metal-Oxide-Semiconductor HEMTs with Atomic-Layer-Deposited Al
[2009-12-25]
InAs-Channel Metal-Oxide-Semiconductor HEMTs with Atomic-Layer-Deposited Al2O3 Gate Dielectric
Chang CY, Hsu HT, Chang EY, et al.
ELECTROCHEMICAL AND SOLID STATE LETTERS   卷: 12   期: 12   页: H456-H459   出版年: 2009
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