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Direct Evidence of Polycrystalline Silicon Thin Films Formation During Alum [2009-07-16] |
| Direct Evidence of Polycrystalline Silicon Thin Films Formation During Aluminum Induced Crystallization by In-Situ Heating TEM Observation Seiichiro Ii, Takeshi Hirota, Kensuke Fujimoto, Youhei Sugimoto, Naoki Takata, Ken-ichi Ideda, Hideharu Nakashima and Hiroshi Nakashima Materials Transactions, Vol.49, No.4(2008) pp.723-727 附件下载 |
