Leakage Current Mechanisms in Silicon Carbide MOSFETs - A Review
Review Paper
Published: 28 August 2025
Volume 26, pages 779–800, (2025)
Cite this article
Baba, T., Hasbullah, N.F., Saidin, N. et al. Leakage Current Mechanisms in Silicon Carbide MOSFETs - A Review. Trans. Electr. Electron. Mater. 26, 779–800 (2025). https://doi.org/10.1007/s42341-025-00668-y