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Use of precision density and lattice parameter measurements for study of point defects in single. I [2025-08-11] |
| A.N. MOROZOV and V.T. BUBLIK Department of Semiconductor Materials and Devices, Moscow Steel and Alloys Institute, Leninskii Prospekt 4, 117936 Moscow USSR Received 10 July 1985; manuscript received in final form 24 January 1986 Use_of_precision_density_and_lattice_parameter_measurements_for_study_of_point_defects_in_single._I.pdf |
