M. Schulz,

Interface states at the SiO2-Si interface,

Surface Science,

Volume 132, Issues 1–3,

1983,

Pages 422-455,

ISSN 0039-6028,

https://doi.org/10.1016/0039-6028(83)90551-4.

(https://www.sciencedirect.com/science/article/pii/0039602883905514)