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Simulation of defect assisted tunneling and its effect on I-V characteristics in resonant tunneling diodes [2024-11-28] |
| Sangyong Lee, M. H. Weichold. D. L. Parker and G. Spencer, "Simulation of defect assisted tunneling and its effect on I-V characteristics in resonant tunneling diodes", Proc. of the Ninth Intl. Conf. on the NASECODE, Copper Mountain, CO, April 6-9, 1993. Simulation_of_defect_assisted_tunneling_and_its_effect_on_I-V_characteristics_in_resonant_tunneling_diodes.pdf |
