Raman and Photocurrent Imaging of Electrical Stress-Induced p-n Junctions in Graphene
作者:Rao, G (Rao, Gayathri)[ 1 ] ; Freitag, M (Freitag, Marcus)[ 1 ] ; Chiu, HY (Chiu, Hsin-Ying)[ 1 ] ; Sundaram, RS (Sundaram, Ravi S.)[ 1 ] ; Avouris, P(Avouris, Phaedon)[ 1 ]

ACS NANO

卷: 5
  期: 7
  页: 5848-5854
DOI: 10.1021/nn201611r

出版年: JUL 2011