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Microstructure and Dangling Bond Defects in Amorphous Hydrogenated Silicon Deposited Near Room Temperature
[2014-05-26]

Microstructure and Dangling Bond Defects in Amorphous Hydrogenated Silicon Deposited Near Room Temperature

1992 MRS Spring Meeting.
Man Ken Cheung and Mark A. Petrich
a1 Department of Chemical Engineering, Northwestern University, Evanston, IL 60208, USA
MRS ProceedingsMRS Proceedings / Volume 258 / 1992


26142335172.pdf
26142335172.pdf