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Ultimate Scaling of CMOS Logic Devices with Ge and III–V Materials [2014-03-31] |
| Ultimate Scaling of CMOS Logic Devices with Ge and III–V Materials 作者：M. Heyns and W. Tsai 刊名：MRS Bulletin 出版日期：2009 期号：No.7 卷号：Vol.34 31103229918.pdf 31103229918.pdf |
