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Study of defects in LEC-grown undoped SI-GaAs by thermally stimulated curre
[2011-05-10]
Materials Science and Engineering: B
Volume 5, Issue 3, February 1990, Pages 397-408
题目:Study of defects in LEC-grown undoped SI-GaAs by thermally stimulated current spectroscopy
作者:Zhaoqiang Fanga, Lei Shana, T.E. Schlesingera and A.G. Milnes

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