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Towards synchrotron-based nanocharacterization [2010-05-13] |
Towards synchrotron-based nanocharacterization Bleuet, P.; Arnaud, L.; Biquard, X.; Cloetens, P.; Doyen, L.; Gergaud, P.; Lamontagne, P.; Lavayssie re, M.; Micha, J.-S.; Renault, O.; Rieutord, F.; Susini, J.; Ulrich, O. AIP Conference Proceedings 卷: 1173 页: 181-7 出版年: 2009 附件下载 |