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Change of the electron effective mass in extremely heavily doped n-type Si
[2011-03-24]

Change of the electron effective mass in extremely heavily doped n-type Si obtained by ion implantation and laser annealing.
M. Miyao, T. Motooka, N. Natsuaki and T. Tokuyama.
Solid State Communications, Volume 37, Issue 7, February 1981, Pages 605-608


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