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The reliability of tunnel junction regenerated light emitting diodes
[2009-11-16]
The reliability of tunnel junction regenerated light emitting diodes
  作者:Xiaoming Wang, Weiling Guo, Yongtao Tian, Xia Guo, Guo Gao, and Guangdi Shen
  出处:Proc. SPIE,2005,6020:60201X

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