Hole drift mobility measurements on a-Si:H using surface and uniformly absorbed illumination
Dinca, Steluta A. (Department of Physics, Syracuse University, Syracuse, NY 13244-1130, United States); Schiff, Eric A.; Guha, Subhendu; Yan, Baojie; Yang, Jeff Source: Materials Research Society Symposium Proceedings, v 1153, p 325-330, 2009, Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009