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Microstructural characterization of polycrystalline Si films grown by vapor [2010-11-30] |
| Microstructural characterization of polycrystalline Si films grown by vapor-induced crystallization of amorphous Si using Al/Ni chloride 作者: Eom JH (Eom, Ji Hye), Lee KU (Lee, Kye Ung), Ahn BT (Ahn, Byung Tae) 来源出版物: JOURNAL OF THE ELECTROCHEMICAL SOCIETY 卷: 154 期: 3 页: H194-H197 出版年: 2007 附件下载 |
