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High-resolution x-ray diffraction studies of highly curved GaN layers prepa [2009-10-30] |
| High-resolution x-ray diffraction studies of highly curved GaN layers prepared by hydride vapor phase epitaxy J. Q. Liu, Y. X. Qiu, J. F. Wang, X. Guo, K. Huang, K. Xu, and H. Yang Proc. SPIE Vol. 7518, 75180G 附件下载 |
