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LOW-TEMPERATURE MOBILITY BEHAVIOR IN SUBMICRON MOSFETS AND RELATED DETERMIN [2012-03-21] |
| LOW-TEMPERATURE MOBILITY BEHAVIOR IN SUBMICRON MOSFETS AND RELATED DETERMINATION OF CHANNEL LENGTH AND SERIES RESISTANCE 作者: NGUYENDUC C; CRISTOLOVEANU S; GHIBAUDO G 来源出版物: SOLID-STATE ELECTRONICS 卷: 29 期: 12 页: 1271-1277 DOI: 10.1016/0038-1101(86)90133-4 出版年: DEC 1986 附件下载 |
