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DECAY IN PHOTOCONDUCTIVITY ASSOCIATED WITH HOLE TRAPS IN N-TYPE SILICON [2012-11-23] |
| DECAY IN PHOTOCONDUCTIVITY ASSOCIATED WITH HOLE TRAPS IN N-TYPE SILICON 作者: HAYNES, JR (HAYNES, JR); HORNBECK, JA (HORNBECK, JA) 来源出版物: PHYSICAL REVIEW 卷: 94 期: 5 页: 1438-1438 出版年: 1954 附件下载 |
