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Characterization of Silicon Dioxide Films on a 4H-SiC Si(0001) Face by Four [2011-12-29] |
| Characterization of Silicon Dioxide Films on a 4H-SiC Si(0001) Face by Fourier Transform Infrared (FT-IR) Spectroscopy and Cathodoluminescence Spectroscopy 来源: APPLIED SPECTROSCOPY [0003-7028] Yoshikawa 年: 2011 卷: 65 页: 543 附件下载 |
