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Chemical Composition and Characterization of the Si/C Interface in Poly-Si [2010-12-22] |
| Chemical Composition and Characterization of the Si/C Interface in Poly-Si Thin Films on Graphite Substrates Journal Solid State Phenomena (Volumes 51 - 52) Volume Polycrystalline Semiconductors IV Authors T. Reindl, T. Fuska, C. Walz, Hans Cerva, R. Lemme, C. Weitzel, W. Kruehler, M. Pauli, Johannes Mueller Pages 295-300 附件下载 |
