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Investigation of defect formation in 4H-SiC(0001) and (000-1) epitaxy [2010-04-29] |
Investigation of defect formation in 4H-SiC(0001) and (000-1) epitaxy 作者:Tsuchida, H.; Kamata, I.; Nagano, M. 来源出版物: Materials Science Forum 卷: 600-603 页: 267-72 出版年: 2009 附件下载
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