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Investigation of defect formation in 4H-SiC(0001) and (000-1) epitaxy
[2010-04-29]
Investigation of defect formation in 4H-SiC(0001) and (000-1) epitaxy
作者:Tsuchida, H.; Kamata, I.; Nagano, M. 
来源出版物: Materials Science Forum 卷: 600-603  页: 267-72  出版年: 2009
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