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Depth measurements of etch-pits in GaN with shape reconstruction from SEM images
[2020-04-03]

Depth measurements of etch-pits in GaN with shape reconstruction from SEM images.

  • 【作 者】Wzorek, M.;Czerwinski, A.;Ratajczak, J.;Lui, A.;Iacob, E.;Katcki, J.

  • 【刊 名】Journal of Microscopy (Oxford, United Kingdom)

  • 【出版日期】2011

  • 【卷 号】Vol.237

  • 【期 号】No.3

  • 【页 码】242-245

Depth measurements of etch‐pits in GaN with shape reconstruction from SEM images.pdf