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Scanning photocurrent microscopy: A new technique to study inhomogeneously
[2011-03-17]

Scanning photocurrent microscopy: A new technique to study inhomogeneously distributed recombination centers in semiconductors

 Solid-State Electronics, Volume 21, Issues 11-12, November-December 1978, Pages 1519-1524
David V. Lang, Charles H. Henry


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