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Challenges in large-area multi-wafer SiC epitaxy for production needs
[2009-09-23]
Challenges in large-area multi-wafer SiC epitaxy for production needs
作者: Thomas B (Thomas, Bernd), Hecht C (Hecht, Christian), Stein R (Stein,Rene), Friedrichs P (Friedrichs, Peter)
Materials science forum   2006, vol. 527-29 (1), pp. 135-140 
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