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Temperature Dependence of Forward and Reverse Characteristics of Ti, W, Ta [2011-09-09] |
| Temperature Dependence of Forward and Reverse Characteristics of Ti, W, Ta and Ni Schottky Diodes on 4H-SiC”， Journal Materials Science Forum (Volumes 353 - 356) Volume Silicon Carbide and Related Materials 2000 Edited by G. Pensl, D. Stephani and M. Hundhausen Pages 679-682 附件下载 |
