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High-resolution resistivity mapping of bulk semi-insulating GaAs by point-c [2010-10-20] |
| High-resolution resistivity mapping of bulk semi-insulating GaAs by point-contact technique author:W. Siegel, G. Kühnel, , C. Reichel, M. Jurisch and B. Hoffmann Materials Science and Engineering: B Volume 44, Issues 1-3, February 1997, Pages 238-241 附件下载 |
