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Plasma-Induced Damage Influence on the n-Contact Properties and Device Perf [2011-01-27] |
| Title: Plasma-Induced Damage Influence on the n-Contact Properties and Device Performance of Ultraviolet InGaN/AlGaN Light-Emitting Diodes Author: S.-M. Kim, Y.-M. Yu, J.-H. Baek, S.-R. Jeon, H.-J. Ahn and J.-S. Jang Year: 2007 Journal: Journal of The Electrochemical Society Volume: 154 Issue: 5 Pages: H384-H388 附件下载 |
