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Detailed Investigation of GaN Metal-Insulator-Semiconductor Structures by Capacitance-Voltage and Deep Level Transient Spectroscopy Methods [2016-09-12] |
| Detailed Investigation of GaN Metal-Insulator-Semiconductor Structures by Capacitance-Voltage and Deep Level Transient Spectroscopy Methods Mater. Res. Soc. Symp. Proc. Vol. 1108 1108-A09-24 12122650247.pdf |
