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Co-registered Topographical, Band Excitation Nanomechanical, and Mass Spectral Imaging Using a Combined Atomic Force Microscopy/Mass Spectrometry Platform
[2015-05-13]

Co-registered Topographical, Band Excitation Nanomechanical, and Mass Spectral Imaging Using a Combined Atomic Force Microscopy/Mass Spectrometry Platform

ACS Nano, 2015, 9 (4), pp 4260–4269
DOI: 10.1021/acsnano.5b00659
Publication Date (Web): March 18, 2015
Copyright © 2015 American Chemical Society


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