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Exploring failure mechanisms of near ultraviolet AlGaN/GaN light-emitting diodes by reverse-bias stress in water vapour [2015-05-07] |
| Exploring failure mechanisms of near ultraviolet AlGaN/GaN light-emitting diodes by reverse-bias stress in water vapour
卷: 期: 页: DOI: 出版年: 7152826195.pdf |
