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Investigation of Band-Offsets at Monolayer–Multilayer MoS2 Junctions by Scanning Photocurrent Microscopy
[2015-04-09]
Investigation of Band-Offsets at Monolayer–Multilayer MoS2 Junctions by Scanning Photocurrent Microscopy
Sarah L. Howell, Deep Jariwala, Chung-Chiang Wu, Kan-Sheng Chen, Vinod K. Sangwan, Junmo Kang, Tobin J. Marks, Mark C. Hersam, and Lincoln J. Lauhon
pp 2278–2284
Publication Date (Web): March 25, 2015 (Letter)
DOI: 10.1021/nl504311p
995129642.pdf