首 页 >> 上架新书
Advances in Materials Characterization [2009-07-14] |
| Baldev Raj, Indira Gandhi Centre for Atomic Research, Tamil Nadu, India; G. Amarendra, Indira Gandhi Centre for Atomic Research, Tamil Nadu, India; M.H. Manghnani, High Pressure Science Lab, University of Hawaii, Manoa
索书号：TB302/A485
Table of Contents
Preface Introduction to Materials Characterization; Baldev Raj, G. Amarendra and M. H. Manghnani Atomistic Characterization of Materials using Scanning Tunneling Microscopy (STM); Prof. S. Dharmadhikari, India Recent Advances in Characterization of Materials using Electron Microscopy; Dr. M. Vijayalakshmi, India X-ray Reflectance for Characterization of Multilayer Thin Films; Prof. Ajay Gupta, India in national and international journals. Latest Trends in Acoustic NDT Studies for Materials Characterization; Prof. C. H. Chen, USA, T. Jayakumar and Anish Kumar, India Characterization of Soft Condensed Matter using Confocal Microscopy; Dr. B.V. R. Tata and Dr. Baldev Raj, India Positron Annihilation Studies of Materials for Electronic Devices; Prof. R.. Suzuki, Japan and Dr.G . Amarendra, India Elasticity Characterization of Covalent (B-C-N) Hard Materials and Films by Brillouin Scattering; Prof. P.V. Zinn and Prof. M.H, Manghnani, USA |
