Radiation Effects in Semiconductors

索书号： 28 /I56

Section I: Devices

Radiation Damage in Silicon

Radiation-Tolerant CMOS Single-Photon Imagers for Multiradiation Detection, L. Carrara, E. Charbon, C. Niclass, N. Scheidegger, and H. Shea

Effects of Hydrogen on the Radiation Response of Field-Oxide

Field-Effect Transistors and High-K Dielectrics, D.M. Fleetwood, R.D. Schrimpf, and X.J. Zhou

Novel Total Dose and Heavy-Ion Charge Collection Phenomena in a New SiGe HBT on Thin-Film SOI Technology, G. Avenier, M. Bellini, A. Chantre, P. Cheng, P. Chevalier, J.D. Cressler, R.M. Diestelhorst, P.W. Marshall, S.D. Phillips, and M. Turowski

Radiation-Hard Voltage and Current References in Standard CMOS Technologies

Nanocrystal Memories: An Evolutionary Approach to Flash Memory Scaling and a Class of Radiation-Tolerant Devices, C. Gerardi, A. Cester, S. Lombardo, R. Portoghese, and N. Wrachien




Section II: Circuits and Systems

Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation, L.T. Clark

A Complete Guide to Multiple Upsets in SRAMs Processed in Decananometric CMOS Technologies

Real-Time Soft Error Rate Characterization of Advanced SRAMs, J.-L. Autran, G. Gasiot, D. Munteanu, P. Roche, and S. Sauze

Fault Tolerance Techniques and Reliability Modeling for SRAM-Based FPGAs

Assuring Robust Triple Modular Redundancy Protected Circuits in SRAM-Based FPGAs, M. Caffrey, P. Graham, J. Krone, K. Lundgreen, K. Morgan, B. Pratt, and H. Quinn

SEU/SET Tolerant Phase-Locked Loops, R.L. Shuler, Jr.

Autonomous Detection and Characterization of Radiation-Induced Transients in Semiconductor Integrated Circuits

Soft Errors in Digital Circuits: Overview and Protection Techniques for Digital Filters

Fault-Injection Techniques for Dependability Analysis: An Overview, M. Violante

Index