索书号 TN432.05/G768

Table of contents (16 chapters)

Part I Beyond Lucky Electrons

l  From Atoms to Circuits: Theoretical and Empirical Modeling of HotCarrier Degradation

l  The Energy Driven Hot Carrier Model

l  Hot-Carrier Degradation in Decananometer CMOS Nodes: From anEnergy-Driven to a Unified Current Degradation Modeling by a Multiple-CarrierDegradation Process

l  Physics-Based Modeling of Hot-Carrier Degradation

l  Semi-analytic Modeling for Hot Carriers in Electron Devices

l  The Spherical Harmonics Expansion Method for Assessing Hot CarrierDegradation

l  Recovery from Hot Carrier Induced Degradation Through TemperatureTreatment

l  Characterization of MOSFET Interface States Using the Charge PumpingTechnique

Part II CMOS and Beyond

l  Channel Hot Carriers in SiGe and Ge pMOSFETs

l  Channel Hot Carrier Degradation and Self-Heating Effects in FinFETs

l  Characterization and Modeling of High-Voltage LDMOS Transistors

l  Compact Modelling of the Hot-Carrier Degradation of Integrated HVMOSFETs

l  Hot-Carrier Degradation in Silicon-Germanium Heterojunction BipolarTransistors

Part III Circuits

l  Hot-Carrier Injection Degradation in Advanced CMOS Nodes: ABottom-Up Approach to Circuit and System Reliability

l  Circuit Reliability: Hot-Carrier Stress of MOS Transistors inDifferent Fields of Application

l  Reliability Simulation Models for Hot Carrier Degradation

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