This issue's features include:

    THIN-FILM METROLOGY: Ellipsometry characterizes thin-films in the IR

    AVALANCHE PHOTODIODES (APDs): Waveguide-integrated Ge/Si APD performs beyond 100 GHz

    ASPHERES: Variable optical null advances asphere metrology

    PHOTONIC FRONTIERS: Next-gen photovoltaics

    MULTISPECTRAL IMAGING: Reflective optics address high-power multiwavelength challenges

    全文请阅：http://172.16.70.103:8080/tsh//zhuanlan/zhuanjiquanwen/LFW_20100801_Aug_2010.PDF